IEEE - Institute of Electrical and Electronics Engineers, Inc. - SPSIM: A Superpixel-Based Similarity Index for Full-Reference Image Quality Assessment

Author(s): Wen Sun ; Qingmin Liao ; Jing-Hao Xue ; Fei Zhou
Sponsor(s): IEEE Signal Processing Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2018
Volume: 27
Page(s): 4,232 - 4,244
ISSN (Electronic): 1941-0042
ISSN (Paper): 1057-7149
DOI: 10.1109/TIP.2018.2837341
Regular:

Full-reference image quality assessment algorithms usually perform comparisons of features extracted from square patches. These patches do not have any visual meanings. On the contrary, a... View More

Advertisement