IEEE - Institute of Electrical and Electronics Engineers, Inc. - Application of scan-less two-dimensional confocal microscopy based on a combination of confocal slit with wavelength/space conversion

Author(s): Eiji Hase ; Takeo Minamikawa ; Shuji Miyamoto ; Yasuhiro Mizutani ; Tetsuo Iwata ; Hirotsugu Yamamoto ; Yasui Takeshi
Sponsor(s): IEEE Lasers and Electro-Optics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1558-4542
ISSN (Paper): 1077-260X
DOI: 10.1109/JSTQE.2018.2869615
Regular:

Confocal laser microscope (CLM) has been widely used in the fields of the non-contact surface topography, biomedical imaging, and other applications, because the confocality gives two-dimensional... View More

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