IEEE - Institute of Electrical and Electronics Engineers, Inc. - Persistence Atlas for Critical Point Variability in Ensembles

Author(s): Guillaume Favelier ; Noura Faraj ; Brian Summa ; Julien Tierny
Sponsor(s): IEEE Comput. Soc. Tech. Committee on Comput. Graphics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (CD): 2160-9306
ISSN (Electronic): 1941-0506
ISSN (Paper): 1077-2626
DOI: 10.1109/TVCG.2018.2864432
Regular:

This paper presents a new approach for the visualization and analysis of the spatial variability of features of interest represented by critical points in ensemble data. Our framework, called... View More

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