IEEE - Institute of Electrical and Electronics Engineers, Inc. - Reliability Analysis of IoT Networks with Community Structures

Author(s): Yuchang Mo ; Liudong Xing ; Wenzhong Guo ; Shaobin Cai ; Zhao Zhang ; Jian Hui Jiang
Sponsor(s): IEEE Computer Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (CD): 2334-329X
ISSN (Electronic): 2327-4697
DOI: 10.1109/TNSE.2018.2869167
Regular:

Network infrastructure and connectivity in the Internet of Things (IoT) applications are becoming increasingly complex and heterogeneous, opening up many challenges including reliability. Many... View More

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