IEEE - Institute of Electrical and Electronics Engineers, Inc. - X-ray Phase Contrast Imaging By Talbot-Lau Interferometer Without Phase-stepping Device

Author(s): Feng Rong ; Ying Liang ; Wei Xu ; Yaohu Lei ; Ji Li
Sponsor(s): IEEE Lasers and Electro-Optics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1941-0174
ISSN (Paper): 1041-1135
DOI: 10.1109/LPT.2018.2869423
Regular:

A new X-ray phase-contrast imaging on Talbot- Lau interferometer without phase-stepping device is proposed. A new analyzer grating is designed to replace the existing analyzer grating and... View More

Advertisement