IEEE - Institute of Electrical and Electronics Engineers, Inc. - Deep Principal Component Analysis Based on Layerwise Feature Extraction and Its Application to Nonlinear Process Monitoring

Author(s): Xiaogang Deng ; Xuemin Tian ; Sheng Chen ; Chris J. Harris
Sponsor(s): IEEE Control Systems Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1 - 15
ISSN (CD): 2374-0159
ISSN (Electronic): 1558-0865
ISSN (Paper): 1063-6536
DOI: 10.1109/TCST.2018.2865413
Regular:

In order to deeply exploit intrinsic data feature information hidden among the process data, an improved kernel principal component analysis (KPCA) method is proposed, which is referred to as deep... View More

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