IEEE - Institute of Electrical and Electronics Engineers, Inc. - Data Classification using Active Learning based Data Modification: An Application to Churn Prediction

2017 International Conference on Current Trends in Computer, Electrical, Electronics and Communication (CTCEEC)

Author(s): M. A. R. Khalid ; M. A. H. Farquad ; V. Kamakshi Prasad
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2017
Conference Location: Mysore, India, India
Conference Date: 8 September 2017
Page(s): 529 - 533
ISBN (CD): 978-1-5386-3240-6
ISBN (Electronic): 978-1-5386-3243-7
ISBN (DVD): 978-1-5386-3241-3
ISBN (Paper): 978-1-5386-3242-0
DOI: 10.1109/CTCEEC.2017.8454989
Regular:

Support Vector Machine (SVM) is on one of its kind of data mining algorithm, tends to always give away the global optimum solution to any given problem because of its convex optimization problem... View More

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