IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Critical Analysis of the V-Model of Big Data

2018 17th IEEE International Conference On Trust, Security And Privacy In Computing And Communications/ 12th IEEE International Conference On Big Data Science And Engineering (TrustCom/BigDataSE)

Author(s): Alaa Alsaig ; Vangular Alagar ; Olga Ormandjieva
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2018
Conference Location: New York, NY, USA, USA
Conference Date: 1 August 2018
Page(s): 1,809 - 1,813
ISBN (Electronic): 978-1-5386-4388-4
ISSN (Electronic): 2324-9013
DOI: 10.1109/TrustCom/BigDataSE.2018.00273
Regular:

In order to provide a solid and stable platform for Big Data (BD) management and application development, a generic model of BD needs to be agreed upon. There is no firm consensus on what defines... View More

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