IEEE - Institute of Electrical and Electronics Engineers, Inc. - AFM Tip Position Control in situ for Effective Nano-Manipulation

Author(s): Yuan Shuai ; Zhidong Wang ; Ning Xi ; Yuechao Wang ; Lianqing Liu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1941-014X
ISSN (Paper): 1083-4435
DOI: 10.1109/TMECH.2018.2868983
Regular:

The spatial uncertainties of atomic force microscope (AFM) tip position hinder the development of the AFM based nano-manipulation. These uncertainties cannot be corrected at nanoscale using the... View More

Advertisement