IEEE - Institute of Electrical and Electronics Engineers, Inc. - Active Contour Model Based on Local Intensity Fitting Energy for Image Segmentation and Bias Estimation

Author(s): Xiaoying Shan ; Xiaoliang Gong ; Asoke K. Nandi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 2169-3536
DOI: 10.1109/ACCESS.2018.2863719
Regular:

Intensity nonuniformity is one of the common issues in image segmentation, which is caused by technical limitations or external interference. In this work, a novel region-based active contour... View More

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