IEEE - Institute of Electrical and Electronics Engineers, Inc. - Debugging Static Analysis

Author(s): Lisa Nguyen Quang Do ; Stefan Kruger ; Patrick Hill ; Karim Ali ; Eric Bodden
Sponsor(s): IEEE Comput. Soc. Tech. Council on Software Eng.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (CD): 2326-3881
ISSN (Electronic): 1939-3520
ISSN (Paper): 0098-5589
DOI: 10.1109/TSE.2018.2868349
Regular:

Static analysis is increasingly used by companies and individual code developers to detect bugs and security vulnerabilities. As programs grow more complex, the analyses have to support new code... View More

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