IEEE - Institute of Electrical and Electronics Engineers, Inc. - Study on switching characteristics and associated degradation mechanism of contact material under capacitive load

Author(s): Wanbin Ren ; Xu Zhang ; Tengyu Wang ; Jianmin Wei
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 2156-3985
ISSN (Paper): 2156-3950
DOI: 10.1109/TCPMT.2018.2868102
Regular:

Electrical lifetime and relative dynamic welding failure mechanisms of electromechanical relay for capacitive load are interesting topics in the area of switching devices and contact materials. In... View More

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