IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fabric Defect Detection Using Salience Metric for Color Dissimilarity and Positional Aggregation

Author(s): Kaibing Zhang ; Yadi Yan ; Pengfei Li ; Junfeng Jing ; Xiuping Liu ; Zhen Wang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 2169-3536
DOI: 10.1109/ACCESS.2018.2868059
Regular:

In this paper, inspired by an inherent characteristic of human visual system (HVS) capable of recognizing salient regions from a complicated scene, we treat a defective region as a salient region... View More

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