IEEE - Institute of Electrical and Electronics Engineers, Inc. - Enhanced Cavity Sensor in SIW Technology for Material Characterization

Author(s): Enrico Massoni ; Giuseppe Siciliano ; Maurizio Bozzi ; Luca Perregrini
Sponsor(s): IEEE Microwave Theory and Techniques Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1 - 3
ISSN (Electronic): 1558-1764
ISSN (Paper): 1531-1309
DOI: 10.1109/LMWC.2018.2864876
Regular:

This letter presents an enhanced solution for low-cost sensors for the determination of the dielectric permittivity and the loss tangent of materials, based on substrate-integrated... View More

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