IEEE - Institute of Electrical and Electronics Engineers, Inc. - Methods for Determining the Collector Series Resistance in SiGe HBTs—A Review and Evaluation Across Different Technologies

Author(s): Andreas Pawlak ; Julia Krause ; Michael Schroter
Sponsor(s): IEEE Electron Devices Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2018
Volume: 65
Page(s): 3,588 - 3,599
ISSN (Electronic): 1557-9646
ISSN (Paper): 0018-9383
DOI: 10.1109/TED.2018.2853092
Regular:

Many methods have been proposed for the experimental determination of the collector resistance in bipolar junction transistors and HBTs. In this paper, the most widely used methods are reviewed... View More

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