IEEE - Institute of Electrical and Electronics Engineers, Inc. - Thermal Resistance Characterization for Multifinger SOI-MOSFETs

Author(s): Benito Gonzalez ; Raul Rodriguez ; Antonio Lazaro
Sponsor(s): IEEE Electron Devices Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2018
Volume: 65
Page(s): 3,626 - 3,632
ISSN (Electronic): 1557-9646
ISSN (Paper): 0018-9383
DOI: 10.1109/TED.2018.2853799
Regular:

Thermal conductance in multifinger silicon-on-insulator (SOI) metal-oxide-semiconductor field-effect transistors (MOSFETs) is usually modeled at room temperature with a linear... View More

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