IEEE - Institute of Electrical and Electronics Engineers, Inc. - Failure Mechanism of a Low-Energy-Triggered Bulk Gallium Arsenide Avalanche Semiconductor Switch: Simulated Analysis and Experimental Results

Author(s): Long Hu ; Jiancang Su ; Ruicheng Qiu ; Xu Fang ; Jingxuan Wang
Sponsor(s): IEEE Electron Devices Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2018
Volume: 65
Page(s): 3,855 - 3,861
ISSN (Electronic): 1557-9646
ISSN (Paper): 0018-9383
DOI: 10.1109/TED.2018.2859231
Regular:

The failure mechanism is discussed numerically and experimentally in a low-energy-triggered bulk gallium arsenide avalanche semiconductor switch with ultrafast switching. The... View More

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