IEEE - Institute of Electrical and Electronics Engineers, Inc. - Ultra-Wideband Variable Temperature Measurement System for Complex Permeability of Magnetic Thin Film Fe66Co17B16Si1

Author(s): Ya Feng Li ; En Li ; Yun Peng Zhang ; Chao Zhao ; Tao Yang
Sponsor(s): IEEE Magnetics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2018
Volume: 54
Page(s): 1 - 7
ISSN (Electronic): 1941-0069
ISSN (Paper): 0018-9464
DOI: 10.1109/TMAG.2018.2843377
Regular:

In this paper, a measurement system is proposed for the measurement of the complex permeability of magnetic thin film Fe66Co17B16Si1 in the temperature... View More

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