IEEE - Institute of Electrical and Electronics Engineers, Inc. - Heavy Ion, Proton, and Neutron Charge Deposition Analyses in Several Semiconductor Materials

Author(s): Zhenyu Wu ; Shuming Chen
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2018
Volume: 65
Page(s): 1,791 - 1,799
ISSN (Electronic): 1558-1578
ISSN (Paper): 0018-9499
DOI: 10.1109/TNS.2018.2834962
Regular:

The charge deposition of particles in materials is the primary stage in inducing ionization radiation effects. We analyzed charge depositions of heavy ion, proton, and neutron in digital... View More

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