IEEE - Institute of Electrical and Electronics Engineers, Inc. - Physical Mechanisms Inducing Electron Single-Event Upset

Author(s): P. Caron ; C. Inguimbert ; L. Artola ; N. Chatry ; N. Sukhaseum ; R. Ecoffet ; F. Bezerra
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2018
Volume: 65
Page(s): 1,759 - 1,767
ISSN (Electronic): 1558-1578
ISSN (Paper): 0018-9499
DOI: 10.1109/TNS.2018.2819421
Regular:

With the increase of sensitivity of devices to single-event upsets (SEUs), the possibility to trigger an upset with incident electrons has been recently raised. All the mechanisms susceptible to... View More

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