IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Method to Separate Proton Damage in LED and Phototransistor of Optocouplers

Author(s): Farokh Irom ; Larry D. Edmonds ; Gregory R. Allen ; Bernard G. Rax
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2018
Volume: 65
Page(s): 1,553 - 1,560
ISSN (Electronic): 1558-1578
ISSN (Paper): 0018-9499
DOI: 10.1109/TNS.2018.2819960
Regular:

This paper reports proton damage in light-emitting diode (LED) and phototransistor of the Micropac 66296 optocoupler. Our results show that the optocoupler current transfer ratio (CTR) data are... View More

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