IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analysis of Temporal Masking Effects on Master- and Slave-Type Flip-Flop SEUs and Related Applications

Author(s): R. M. Chen ; N. N. Mahatme ; Z. J. Diggins ; L. Wang ; E. X. Zhang ; Y. P. Chen ; Y. N. Liu ; B. Narasimham ; A. F. Witulski ; B. L. Bhuva ; D. M. Fleetwood
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2018
Volume: 65
Page(s): 1,823 - 1,829
ISSN (Electronic): 1558-1578
ISSN (Paper): 0018-9499
DOI: 10.1109/TNS.2018.2823385
Regular:

Analysis of temporal masking effects of single-event upsets (SEUs) on master-slave flip-flops (FFs) is provided, considering the difference of SEU cross sections between master and slave latches.... View More

Advertisement