IEEE - Institute of Electrical and Electronics Engineers, Inc. - On the Efficacy of ECC and the Benefits of FinFET Transistor Layout for GPU Reliability

Author(s): Caio Lunardi ; Fritz Previlon ; David Kaeli ; Paolo Rech
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2018
Volume: 65
Page(s): 1,843 - 1,850
ISSN (Electronic): 1558-1578
ISSN (Paper): 0018-9499
DOI: 10.1109/TNS.2018.2823786
Regular:

Using error-correcting codes (ECCs) is considered one of the most effective ways to mask the effects of radiation-induced faults in memory and computing devices. Unfortunately, with the increased... View More

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