IEEE - Institute of Electrical and Electronics Engineers, Inc. - Experimental Validation of an Equivalent LET Approach for Correlating Heavy-Ion and Laser-Induced Charge Deposition

Author(s): Joel M. Hales ; Ani Khachatrian ; Stephen Buchner ; Nicolas J.-H. Roche ; Jeffrey Warner ; Zachary E. Fleetwood ; Adrian Ildefonso ; John D. Cressler ; Veronique Ferlet-Cavrois ; Dale Mcmorrow
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2018
Volume: 65
Page(s): 1,724 - 1,733
ISSN (Electronic): 1558-1578
ISSN (Paper): 0018-9499
DOI: 10.1109/TNS.2018.2828332
Regular:

Using a laser-equivalent linear energy transfer (LET) approach, strong correlation is found for collected charge following heavy-ion and pulsed-laser excitation in a bulk diode device. By... View More

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