IEEE - Institute of Electrical and Electronics Engineers, Inc. - Impact of D-Flip-Flop Architectures and Designs on Single-Event Upset Induced by Heavy Ions

Author(s): L. Artola ; G. Hubert ; S. Ducret ; J. Mekki ; Ahmad Al Youssef ; N. Ricard
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2018
Volume: 65
Page(s): 1,776 - 1,782
ISSN (Electronic): 1558-1578
ISSN (Paper): 0018-9499
DOI: 10.1109/TNS.2018.2800742
Regular:

This paper highlights the impact of design on the single-event upset (SEU) sensitivity of D-flip-flops (DFFs) used in a readout circuit (ROIC) under heavy ions. New experimental data obtained at... View More

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