IEEE - Institute of Electrical and Electronics Engineers, Inc. - Single Events Induced By Heavy Ions and Laser Pulses in Silicon Schottky Diodes

Author(s): M. Mauguet ; D. Lagarde ; F. Widmer ; N. Chatry ; X. Marie ; E. Lorfevre ; F. Bezerra ; R. Marec ; P. Calvel
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2018
Volume: 65
Page(s): 1,768 - 1,775
ISSN (Electronic): 1558-1578
ISSN (Paper): 0018-9499
DOI: 10.1109/TNS.2018.2813096
Regular:

This paper is dedicated to the investigation of single-event effects (SEEs) in different types of silicon Schottky diodes using heavy ions and laser pulses. The objectives are both to progress in... View More

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