IEEE - Institute of Electrical and Electronics Engineers, Inc. - Experimental Investigation of the Joint Influence of Reduced Supply Voltage and Charge Sharing on Single-Event Transient Waveforms in 65-nm Triple-Well CMOS

Author(s): Mladen Mitrovic ; Michael Hofbauer ; Kay-Obbe Voss ; Horst Zimmermann
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2018
Volume: 65
Page(s): 1,908 - 1,913
ISSN (Electronic): 1558-1578
ISSN (Paper): 0018-9499
DOI: 10.1109/TNS.2018.2823273
Regular:

Full waveforms of single-event transients (SETs) in inverter chains were measured under focused heavy-ion microbeam irradiation. Inverter chains of varying spacings were irradiated with... View More

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