IEEE - Institute of Electrical and Electronics Engineers, Inc. - Investigation of the Influence of Temperature and Annealing on the Radiation Hardness of Silicon Mach–Zehnder Modulators

Author(s): Andrea Kraxner ; Stephane Detraz ; Lauri Olantera ; Carmelo Scarcella ; Christophe Sigaud ; Csaba Soos ; Jan Troska ; Francois Vasey
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2018
Volume: 65
Page(s): 1,624 - 1,631
ISSN (Electronic): 1558-1578
ISSN (Paper): 0018-9499
DOI: 10.1109/TNS.2018.2823863
Regular:

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