IEEE - Institute of Electrical and Electronics Engineers, Inc. - Evaluation of the Suitability of NEON SIMD Microprocessor Extensions Under Proton Irradiation

Author(s): A. Lindoso ; M. Garcia-Valderas ; L. Entrena ; Y. Morilla ; P. Martin-Holgado
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2018
Volume: 65
Page(s): 1,835 - 1,842
ISSN (Electronic): 1558-1578
ISSN (Paper): 0018-9499
DOI: 10.1109/TNS.2018.2823540
Regular:

This paper analyzes the suitability of single-instruction multiple data (SIMD) extensions of current microprocessors under radiation environments. SIMD extensions are intended for software... View More

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