IEEE - Institute of Electrical and Electronics Engineers, Inc. - Secure Scan and Test Using Obfuscation Throughout Supply Chain

Author(s): Xiaoxiao Wang ; Dongrong Zhang ; Miao He ; Donglin Su ; Mark Tehranipoor
Sponsor(s): IEEE Council on Electronic Design Automation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2018
Volume: 37
Page(s): 1,867 - 1,880
ISSN (Electronic): 1937-4151
ISSN (Paper): 0278-0070
DOI: 10.1109/TCAD.2017.2772817
Regular:

Scan-based test is commonly used to increase testability and fault coverage, however, it is also known to be a liability for chip security. Research has shown that intellectual property (IP) or... View More

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