IEEE - Institute of Electrical and Electronics Engineers, Inc. - Academic Fablab at University of Naples Federico II: New Research and Development Opportunities in the Fileds of IoT and Industry 4.0

2018 Workshop on Metrology for Industry 4.0 and IoT

Author(s): L. Angrisani ; P. Arpaia ; F. Bonavolonta ; R. Schiano Lo Moriello
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2018
Conference Location: Brescia, Italy
Conference Date: 16 April 2018
Page(s): 23 - 27
ISBN (Electronic): 978-1-5386-2497-5
ISBN (USB): 978-1-5386-2496-8
DOI: 10.1109/METROI4.2018.8439043
Regular:

IoT is a complex subject and any contribution to its development can only be the result of synergistic activities in various fields of engineering. This revolution is therefore creating the demand... View More

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