IEEE - Institute of Electrical and Electronics Engineers, Inc. - Adaptive Estimation of Joint RF Impairments and Envelope Nonlinear Parameters with Instrument Platform Verification

2018 41st International Conference on Telecommunications and Signal Processing (TSP)

Author(s): Juinn-Horng Deng ; Yuan-Feng Chan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2018
Conference Location: Athens, Greece, Greece
Conference Date: 4 July 2018
Page(s): 1 - 5
ISBN (Electronic): 978-1-5386-4695-3
DOI: 10.1109/TSP.2018.8441396
Regular:

This paper aims to study the estimation of RF imperfections, i.e., frequency independent (FI) IQ imbalance (IQI) and DC IQ offset. Based on the feedback envelope detector signal, a low-complexity... View More

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