IEEE - Institute of Electrical and Electronics Engineers, Inc. - Impacts of Modeling Errors and Randomness on Topology Identification of Electric Distribution Network

2018 IEEE International Conference on Probabilistic Methods Applied to Power Systems (PMAPS)

Author(s): Wanghao Fei ; John N. Jiang ; Di Wu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2018
Conference Location: Boise, ID, USA, USA
Conference Date: 24 June 2018
Page(s): 1 - 6
ISBN (Electronic): 978-1-5386-3596-4
ISBN (USB): 978-1-5386-3595-7
DOI: 10.1109/PMAPS.2018.8440474
Regular:

A few models have been established to study the relationship between SCADA voltages in the cyber layer and the topology of electric distribution networks in the physical layer. While these models... View More

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