IEEE - Institute of Electrical and Electronics Engineers, Inc. - Dual Low-Rank Decompositions for Robust Cross-View Learning

Author(s): Zhengming Ding ; Yun Fu
Sponsor(s): IEEE Signal Processing Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1941-0042
ISSN (Paper): 1057-7149
DOI: 10.1109/TIP.2018.2865885
Regular:

Cross-view data are very popular contemporarily, as different view-points or sensors attempt to richly represent data in various views. However, cross-view data from different views present a... View More

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