IEEE - Institute of Electrical and Electronics Engineers, Inc. - Image Provenance Analysis at Scale

Author(s): Daniel Moreira ; Aparna Bharati ; Joel Brogan ; Allan Pinto ; Michael Parowski ; Kevin W. Bowyer ; Patrick J. Flynn ; Anderson Rocha ; Walter J. Scheirer
Sponsor(s): IEEE Signal Processing Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1941-0042
ISSN (Paper): 1057-7149
DOI: 10.1109/TIP.2018.2865674
Regular:

Prior art has shown it is possible to estimate, through image processing and computer vision techniques, the types and parameters of transformations that have been applied to the content of... View More

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