IEEE - Institute of Electrical and Electronics Engineers, Inc. - A New SOLT Calibration Method for Leaky On-Wafer Measurements Using a 10-Term Error Model

Author(s): Chen Liu ; Aihua Wu ; Chong Li ; Nick Ridler
Sponsor(s): IEEE Microwave Theory and Techniques Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2018
Volume: 66
Page(s): 3,894 - 3,900
ISSN (Electronic): 1557-9670
ISSN (Paper): 0018-9480
DOI: 10.1109/TMTT.2018.2832052
Regular:

We present a new short-open-load-thru (SOLT) calibration method for on-wafer S-parameter measurements. The new calibration method is based on a 10-term error model which is a simplified... View More

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