IEEE - Institute of Electrical and Electronics Engineers, Inc. - Failure handling for transaction hierarchies

Proceedings 13th International Conference on Data Engineering

Author(s): Qiming Chen ; Dayal, U.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Birmingham, UK, UK
Conference Date: 7 April 1997
Page(s): 245 - 254
ISBN (Paper): 0-8186-7807-0
ISSN (Paper): 1063-6382
DOI: 10.1109/ICDE.1997.581781
Regular:

Previously, failure recovery mechanisms have been developed separately for nested transactions and for transactional workflows specified as "flat" flow graphs. The paper develops unified... View More

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