IEEE - Institute of Electrical and Electronics Engineers, Inc. - Multi-Probe Micro-Assembly

3rd Annual IEEE Conference on Automation Science and Engineering

Author(s): J. Wason ; W. Gressick ; J.T. Wen ; J. Gorman ; N. Dagalakis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Scottsdale, AZ, USA
Conference Date: 22 September 2007
Page(s): 63 - 68
ISBN (CD): 978-1-4244-1154-2
ISBN (Paper): 978-1-4244-1153-5
DOI: 10.1109/COASE.2007.4341814
Regular:

This paper describes the algorithm development and experimental results of a multi-probe micro-assembly system. The experimental testbed consists of two actuated probes, an actuated die stage, and... View More

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