IEEE - Institute of Electrical and Electronics Engineers, Inc. - Diagnosability Analysis and Sensor Selection in Discrete-Event Systems with Permanent Failures

3rd Annual IEEE Conference on Automation Science and Engineering

Author(s): J. Pan ; S. Hashtrudi-Zad
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Scottsdale, AZ, USA
Conference Date: 22 September 2007
Page(s): 869 - 874
ISBN (CD): 978-1-4244-1154-2
ISBN (Paper): 978-1-4244-1153-5
DOI: 10.1109/COASE.2007.4341765
Regular:

In this paper, the problems of failure diagnosability and sensor selection for failure detection and isolation in discrete-event systems are studied. The system could operate in normal condition,... View More

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