IEEE - Institute of Electrical and Electronics Engineers, Inc. - The importance of At-Speed Scan Testing: an industrial experience

2007 10th Euromicro Conference on Digital System Design: Architectures, Methods and Tools

Author(s): F. Baronti ; R. Roncella ; R. Saletti ; P. D'Abramo ; L. Di Piro ; H. Fabian ; M. Giardi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2007
Conference Location: Lubeck, Germany
Conference Date: 29 August 2007
Page(s): 672 - 675
ISBN (Paper): 978-0-7695-2978-3
DOI: 10.1109/DSD.2007.4341540
Regular:

At-speed scan testing is becoming more and more popular in the semiconductor industry, as the relevance of delay-induced defects increases with CMOS process scaling and consequent IC complexity... View More

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