IEEE - Institute of Electrical and Electronics Engineers, Inc. - Hierarchical Identification of Untestable Faults in Sequential Circuits

2007 10th Euromicro Conference on Digital System Design: Architectures, Methods and Tools

Author(s): J. Raik ; R. Ubar ; A. Krivenko ; M. Kruus
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2007
Conference Location: Lubeck, Germany
Conference Date: 29 August 2007
Page(s): 668 - 671
ISBN (Paper): 978-0-7695-2978-3
DOI: 10.1109/DSD.2007.4341539
Regular:

Similar to sequential test pattern generation, the problem of identifying untestable faults in sequential circuits remains unsolved. Most of the previous works in untestability identification... View More

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