IEEE - Institute of Electrical and Electronics Engineers, Inc. - An Efficient BIST Scheme for Non-Restoring Array Dividers

2007 10th Euromicro Conference on Digital System Design: Architectures, Methods and Tools

Author(s): H.T. Vergos
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2007
Conference Location: Lubeck, Germany
Conference Date: 29 August 2007
Page(s): 664 - 667
ISBN (Paper): 978-0-7695-2978-3
DOI: 10.1109/DSD.2007.4341538
Regular:

A new effective built-in self-test (BIST) scheme for non- restoring array dividers (NADs) is proposed, that offers more than 99% cell fault coverage in all NADs of practical use. Moreover, it can... View More

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