IEEE - Institute of Electrical and Electronics Engineers, Inc. - Scaling Analytical Models for Soft Error Rate Estimation Under a Multiple-Fault Environment

2007 10th Euromicro Conference on Digital System Design: Architectures, Methods and Tools

Author(s): C.J. Hescott ; D.C. Ness ; D.J. Lilja
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2007
Conference Location: Lubeck, Germany
Conference Date: 29 August 2007
Page(s): 641 - 648
ISBN (Paper): 978-0-7695-2978-3
DOI: 10.1109/DSD.2007.4341535
Regular:

With continuing increase in soft error rates, its foreseeable that multiple faults will eventually need to be considered when modeling circuit sensitivity and evaluating fault- tolerance... View More

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