IEEE - Institute of Electrical and Electronics Engineers, Inc. - An On-Line BIST Technique for Stuck-Open Fault Detection in CMOS Circuits

2007 10th Euromicro Conference on Digital System Design: Architectures, Methods and Tools

Author(s): E.K. Moghaddam ; S. Hessabi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2007
Conference Location: Lubeck, Germany
Conference Date: 29 August 2007
Page(s): 619 - 625
ISBN (Paper): 978-0-7695-2978-3
DOI: 10.1109/DSD.2007.4341532
Regular:

This paper presents a simulation-based study of the stuck-open fault testing in CMOS logic circuits. A novel built-in self-test (BIST) technique is presented for detecting stuck-open faults in... View More

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