IEEE - Institute of Electrical and Electronics Engineers, Inc. - Hybrid BIST Optimization Using Reseeding and Test Set Compaction

2007 10th Euromicro Conference on Digital System Design: Architectures, Methods and Tools

Author(s): G. Jervan ; E. Orasson ; H. Kruus ; R. Ubar
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2007
Conference Location: Lubeck, Germany
Conference Date: 29 August 2007
Page(s): 596 - 603
ISBN (Paper): 978-0-7695-2978-3
DOI: 10.1109/DSD.2007.4341529
Regular:

Classical built-in self-test (BIST) approaches are largely based on pseudorandom testing, and using linear feedback shift registers (LFSR) for test set generation and test response compaction. In... View More

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