IEEE - Institute of Electrical and Electronics Engineers, Inc. - Functional Verification of RTL Designs driven by Mutation Testing metrics

2007 10th Euromicro Conference on Digital System Design: Architectures, Methods and Tools

Author(s): Y. Serrestou ; V. Beroulle ; C. Robach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2007
Conference Location: Lubeck, Germany
Conference Date: 29 August 2007
Page(s): 222 - 227
ISBN (Paper): 978-0-7695-2978-3
DOI: 10.1109/DSD.2007.4341472
Regular:

The level of confidence in a VHDL description directly depends on the quality of its verification. This quality can be evaluated by mutation-based test, but the improvement of this quality... View More

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