IEEE - Institute of Electrical and Electronics Engineers, Inc. - Relationship Between Development of Chinese Non-State Owned Enterprises and Cultivation of Scientific and Technological Competence: An Empirical Study by Granger Causality Test

2007 3rd International Conference on Wireless Communications, Networking, and Mobile Computing - WiCOM '07

Author(s): Lanying Du ; Jundong Hou ; Jun Lu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Shanghai, China
Conference Date: 21 September 2007
Page(s): 5,876 - 5,879
ISBN (CD): 978-1-4244-1312-6
ISBN (Paper): 978-1-4244-1311-9
DOI: 10.1109/WICOM.2007.1441
Regular:

Based on the data from 1987 to 2003 released by the China Statistical Bureau, this paper analyzes the correlation between the two variables of development of Chinese non-state owned enterprises... View More

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