IEEE - Institute of Electrical and Electronics Engineers, Inc. - Research on the Defect and Solution of the Technological Innovation in Tianjin Binhai New Area

2007 3rd International Conference on Wireless Communications, Networking, and Mobile Computing - WiCOM '07

Author(s): Qingzhu Qi ; Yaping Wei
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Shanghai, China
Conference Date: 21 September 2007
Page(s): 5,800 - 5,803
ISBN (CD): 978-1-4244-1312-6
ISBN (Paper): 978-1-4244-1311-9
DOI: 10.1109/WICOM.2007.1422
Regular:

Technological innovation is the main power of the district economy development. Tianjin Binhai New Area has been the third capsheaf in the development of Chinese economy. The author illustrates... View More

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