IEEE - Institute of Electrical and Electronics Engineers, Inc. - Dynamic Evaluation of Business Distress Risk Using Hazard Model

2007 3rd International Conference on Wireless Communications, Networking, and Mobile Computing - WiCOM '07

Author(s): Xiao-lan Deng
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Shanghai, China
Conference Date: 21 September 2007
Page(s): 4,543 - 4,546
ISBN (CD): 978-1-4244-1312-6
ISBN (Paper): 978-1-4244-1311-9
DOI: 10.1109/WICOM.2007.1117
Regular:

Using non-paired sample, this paper applies logistic discrete-time hazard model to dynamically evaluate risk of company's business distress within the context of its industry. The results show... View More

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