IEEE - Institute of Electrical and Electronics Engineers, Inc. - Automatic Testing and Automatic Test Systems for Communications Systems

Author(s): K. Bearcroft
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 1972
Volume: 20
Page(s): 1,029 - 1,031
ISSN (Paper): 0090-6778
DOI: 10.1109/TCOM.1972.1091247
Regular:

Over the past years, a considerable number of electronic test facilities have been converted to automatic test systems (ATE).

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